10.6084/m9.figshare.6179063.v1
Altmetric Engineering
Altmetric
Engineering
Amy Lightfoot
Amy
Lightfoot
Stacy Konkiel
Stacy
Konkiel
Introduction to Altmetric’s newest data source, patent citations
Altmetric
2018
altmetrics
Altmetric
Altmetric Explorer for Institutions
patents
knowledge commercialization
Research, Science and Technology Policy
2018-04-24 19:26:59
Media
https://altmetric.figshare.com/articles/media/Introduction_to_Altmetric_s_newest_data_source_patent_citations/6179063
<p>Tracking patent citations to research is an important way to understand how the knowledge is commercialized.</p><p>Altmetric now indexes patents from nine jurisdictions worldwide, including World Intellectual Property Organization, United States Patent and Trademark Office, and the European Patent Office.</p><p><br></p><p>Watch this webinar to learn how to find, visualize, read, and export patent citations using Altmetric products.</p>