10.6084/m9.figshare.6179063.v1 Altmetric Engineering Altmetric Engineering Amy Lightfoot Amy Lightfoot Stacy Konkiel Stacy Konkiel Introduction to Altmetric’s newest data source, patent citations Altmetric 2018 altmetrics Altmetric Altmetric Explorer for Institutions patents knowledge commercialization Research, Science and Technology Policy 2018-04-24 19:26:59 Media https://altmetric.figshare.com/articles/media/Introduction_to_Altmetric_s_newest_data_source_patent_citations/6179063 <p>Tracking patent citations to research is an important way to understand how the knowledge is commercialized.</p><p>Altmetric now indexes patents from nine jurisdictions worldwide, including World Intellectual Property Organization, United States Patent and Trademark Office, and the European Patent Office.</p><p><br></p><p>Watch this webinar to learn how to find, visualize, read, and export patent citations using Altmetric products.</p>