Introduction to Altmetric’s newest data source, patent citations

<p>Tracking patent citations to research is an important way to understand how the knowledge is commercialized.</p><p>Altmetric now indexes patents from nine jurisdictions worldwide, including World Intellectual Property Organization, United States Patent and Trademark Office, and the European Patent Office.</p><p><br></p><p>Watch this webinar to learn how to find, visualize, read, and export patent citations using Altmetric products.</p>