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Introduction to Altmetric’s newest data source, patent citations.mp4 (36.91 MB)
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Patents Launch Webinar, April 2018.pdf (2.45 MB)
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Introduction to Altmetric’s newest data source, patent citations

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posted on 2018-04-24, 19:26 authored by Altmetric EngineeringAltmetric Engineering, Amy LightfootAmy Lightfoot, Stacy KonkielStacy Konkiel

Tracking patent citations to research is an important way to understand how the knowledge is commercialized.

Altmetric now indexes patents from nine jurisdictions worldwide, including World Intellectual Property Organization, United States Patent and Trademark Office, and the European Patent Office.


Watch this webinar to learn how to find, visualize, read, and export patent citations using Altmetric products.

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    altmetricsAltmetricAltmetric Explorer for Institutionspatentsknowledge commercializationResearch, Science and Technology Policy

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