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Introduction to Altmetric’s newest data source, patent citations

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posted on 24.04.2018 by Altmetric Engineering, Amy Lightfoot, Stacy Konkiel

Tracking patent citations to research is an important way to understand how the knowledge is commercialized.

Altmetric now indexes patents from nine jurisdictions worldwide, including World Intellectual Property Organization, United States Patent and Trademark Office, and the European Patent Office.


Watch this webinar to learn how to find, visualize, read, and export patent citations using Altmetric products.

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